Ebook Total-Reflection X-Ray Fluorescence Analysis

[Free Download.Hv7e] Total-Reflection X-Ray Fluorescence Analysis

[Free Download.Hv7e] Total-Reflection X-Ray Fluorescence Analysis

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Book Details :
Published on: 1996-11
Released on:
Original language: English

Over the past decade, total-reflection X-ray fluorescence, or TXRF, has been used increasingly for multi element analysis in laboratories and industry worldwide. Providing reliable, economical readings of the minute mass or low concentration of elements, TXRF is especially suitable for micro- and trace analysis. It is also effective in the analysis of flat sample surfaces and stratified near-surface layers, offering a nondestructive means of quality control of wafers for the semiconductor industry. This is the first book dedicated to this powerful and highly efficient analytical tool. Written by a leading expert with three decades of specialization in X-ray spectral analysis, it features a remarkably readable treatment complete with hundreds of illustrations, equations, and references. Using only a minimum of mathematics, the author focuses on practical applications of TXRF in a variety of disciplines, including geology, biology, material and environmental sciences, medicine, forensics, and art history. The book begins with an introduction to the physical fundamentals of X-ray fluorescence and the principles of total reflection. A survey of TXRF instruments and their operation includes high-power X-ray sources, beam-adapting units, sample positioning, and energy-dispersive detection and registration. Professor Klockenkämper shows readers how to perform analyses, using sample prepa-ration and spectra recording and interpretation, and presents real-world examples from environmental, medical, industrial, art-historical, and forensic applications. The book closes with a discussion of the latest developments in the field, drawing a comparison between TXRF and other methods of analytical atomic spectroscopy. Total-Reflection X-Ray Fluores-cence Analysis helps professionals evaluate the suitability of this method to their specific needs, pinpoint new applications, and gain insight into the future of TXRF. It is an excellent text for graduate students and a useful guide for scientists and technicians in a wide range of fields. This is the first monograph to be devoted entirely to total- reflection X-ray fluorescence (TXRF)-a young, yet powerful method of analytical atomic spectroscopy. Written by a leading expert in X-ray spectral analysis, the book provides an overview of the field, reveals the advantages of TXRF over competing methods, and describes its application in numerous disciplines, including geology, biology, material and environmental sciences, medicine, toxicology, forensics, art history, and archaeology. Tables, figures, equations, and examples are provided throughout. The author discusses both theory and techniques, and walks the reader through the necessary steps to get highly reliable determinations of the minute mass or low concentration of elements. Remarkably communicative and accessible, this book * Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis * Explains instrumentation and setups, particularly high-power X-ray sources, beam-adapting units, sample positioning, and energy-dispersive detection and registration * Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation * Features real-world examples from a variety of disciplines * Includes hundreds of references for further study Elemental analysis products Rigaku - X-ray analytical ... Measure almost any element in almost any matrix ... Systems: Wavelength dispersive Energy Dispersive & Total reflection X-ray fluorescence Multipurpose X-ray diffraction system Rigaku - X-ray ... The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for ... X-ray spectroscopy - Wikipedia X-ray spectroscopy is a gathering name for several spectroscopic techniques for characterization of materials by using x-ray excitation. New Elemental Analysis Techniques for the Analytical ... Wavelength Dispersive X-Ray Fluorescence Spectrometer (WDXRF Spectrometer) X-Ray Fluorescence spectrometers (XRF) use high energy X-rays (or gamma rays) to excite ... List of materials analysis methods - Wikipedia SR - see Muon spin spectroscopy; - see Magnetic susceptibility; A. Analytical ultracentrifugation - Analytical ultracentrifugation; AAS - Atomic absorption ... Laboratory Analytical Techniques Laboratory Analytical Techniques. Analytical laboratory technologies and expertise that delivers detailed chemical information about your samples and products for R&D ... NIMS X-RAY LABORAORY directed by Kenji Sakurai X-Ray Spectrometry and Imaging for Future Materials Research / Buried Interface Sciences by X-Rays and Neutrons / Contribution to Energy Environment and Safety ... Fluorescence Spectroscopy Total reflection x-ray fluorescence (TXRF) spectrometry is an energy-dispersive x-ray technique that is used for elemental and chemical analysis and is especially ... Overview of X-Ray Fluorescence Overview of X-ray Fluorescence Prepared by James M. GuthrieUniversity of Missouri Research Reactor Revised August 2012 Jeffrey R. Ferguson University of Missouri ... X-Ray Spectroscopy Spectroscopy Total reflection x-ray fluorescence (TXRF) spectrometry is an energy-dispersive x-ray technique that is used for elemental and chemical analysis and is especially ...
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